Browsing by Author "Notarte, Jaspher Kim A."

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    Microcontroller-based vendo charging station
    (Don Mariano Marcos Memorial State University - Mid La Union Campus, 2025-05) Ravela, Dexter T.; Acosta, Hannah Grace M.; Andrada, Jake M.; Cabiles, Alijanna Jeame C.; Notarte, Jaspher Kim A.
    This study presents the design, development, and evaluation of a coin-operated, microcontroller-based charging station intended to provide a convenient and accessible solution for recharging electronic devices, particularly in areas with frequent power outages or limited access to conventional electricity. The primary objective was to construct a fully functional prototype—termed the Microcontroller-Based Vendo Charging Station—and assess its performance in terms of operational efficiency and charging effectiveness.The system integrates an Arduino Nano microcontroller, relay module, LCD display, and coin slot mechanism, all governed by custom-developed software. The charging process is activated upon coin insertion, with the system managing current flow and monitoring the charging duration accordingly. Experimental testing demonstrated consistent performance, including a rapid coin detection response averaging 0.65 to 0.67 seconds. Within a fixed 15-minute charging cycle, the system delivered notable power increases—approximately 20% for smartphones and 38% for laptops—highlighting its reliability and compatibility with various devices. Results affirm the technical viability of constructing the device using affordable, readily available components and open-source tools. The system consistently met performance expectations, including reliable coin recognition and effective energy delivery, aligning with the intended project timeline. Its promising output further supports its application as a practical, short-duration charging solution for public and emergency-use contexts. In conclusion, the project achieved its core goals and demonstrates potential for broader deployment. Future enhancements may include exploring cost-reduction strategies, adding protective measures for connected devices, conducting long-term durability tests, and collaborating with electronics professionals to refine the system’s safety and robustness.